Ichikawa, S.; Okazaki, M.

Bacterial survival after ultraviolet (UV) exposure is shaped not only by the extent of DNA damage but also by the physiological state-dependent capacity for DNA repair. Here, we examined the mechanisms underlying growth phase-dependent UV resistance in Escherichia coli K-12 exposed to 262 nm UV irradiation. Stationary-phase cells required higher UV fluence for log inactivation than exponential-phase cells, whereas the levels of UV-induced DNA damage, assessed by cyclobutane pyrimidine dimer staining and real-time PCR, did not differ markedly between the two growth phases. Deletion of nucleotide excision repair (NER) genes, including uvrA, uvrB, uvrC, and uvrD, markedly reduced survival after UV irradiation, indicating that NER is essential for the high UV resistance of stationary-phase cells. Quantitative real-time reverse transcription PCR showed stronger UV-induced expression of several DNA repair and UV resistance genes, including uvrA, uvrB, cho, umuC, and umuD, in stationary-phase cells than in exponential-phase cells. Furthermore, deletion of the DNA cytosine methyltransferase gene dcm increased UV resistance and enhanced the expression of uvrB, cho, umuC, umuD, and sulA in stationary-phase cells. These findings suggest that DNA cytosine methylation modulates UV resistance in E. coli, at least in part by influencing NER- and SOS-associated gene expression.